Fast and Accurate Jitter Amplification Modeling With Variable Pulse Width Response for Statistical BER Analysis in Chiplet Interconnects and Beyond

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Authors: Shenggao Li, Mäher S. Amer
Cited by: 0

Abstract

In this paper, we investigate Statistical Bit Error Rate (BER) analysis for low-loss short-reach chiplet interface and high-loss long-reach serial interface. We used jitter filtering to account for the residue jitter not tracked by a forwarded clock system and proposed a fast and exact Statistical BER method to account for the Tx jitter amplification effect in a high-loss channel. Our proposed method achieves a linear computation complexity.

Fields of Study & Subjects

Low-power high-performance VLSI design Advancements in PLL and VCO Technologies Electromagnetic Compatibility and Noise Suppression

Publication details

Publication date
7 January 2026
Document type
Preprint