Actuarial Voltage Scaling (AVS+): Synthesis and Sensitivity Analysis of a Stochastic Reliability Control Loop
Abstract
As semiconductor process nodes scale below 5nm, degradation mechanisms such as Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) necessitate increasingly pessimistic voltage guardbands to ensure lifetime reliability. Current Adaptive
Fields of Study & Subjects
Semiconductor materials and devices
Low-power high-performance VLSI design
Radiation Effects in Electronics
Publication details
- Publication date
- 7 January 2026
- Document type
- Preprint