Artifact-suppressed and adaptive self-inspired learning denoising for super-resolution fluorescence microscopy

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Authors: Jingyang Zhu, Yuzhen Liu, Yuanyuan Huang, Xianxin Ye, Shiqun Zhao, Xiangyan Ding, Liangyi Chen, Haoyu Li, Liying Qu, Weisong Zhao
Cited by: 1
References: 47

Abstract

Self-supervised denoising methods have advanced fluorescence microscopy by improving photon efficiency and eliminating the need for paired training data, enabling fast and long-term live-cell imaging. However, most computational approaches still struggle with background artifacts that compromise biological interpretation. These artifacts—often amplified by normalization strategies in deep learning approaches—manifest as background inconsistencies and fabricated structures that distort relative intensity relationships. Conventional background removal procedures, whether applied as pre- or post-processing steps, prove inadequate when dealing with diverse biological samples that exhibit varying signal distributions and complex background characteristics. Here, we introduce adaptive-Self-inspired Noise2Noise (SN2N), an adaptive-SN2N framework that employs risk-aware adaptive normalization and Gaussian-weighted overlap inference to suppress artifacts. Adaptive-SN2N was validated on both structured illumination and spinning-disk confocal-based structured illumination microscopes, demonstrating improvement in photon efficiency and effective suppression of background artifacts. We further show its potential to improve downstream segmentation accuracy, particularly for challenging biological structures with sparse distributions and dynamic processes. We anticipate this advancement will enable more robust and accurate biological interpretations across a wide range of imaging conditions.

Fields of Study & Subjects

Advanced Fluorescence Microscopy Techniques Cell Image Analysis Techniques Optical Imaging and Spectroscopy Techniques

Publication details

Journal / source
PhotoniX Life
Publisher
China Science Publishing & Media Ltd.
Volume
1
Issue
0
Pages
7–7
Publication date
1 January 2026
Language
EN