Azimuthal dependence and voltage modulation effects on single event upsets in 16 nm FinFET field programmable gate arrays
Fields of Study & Subjects
Radiation Effects in Electronics
Semiconductor materials and devices
Low-power high-performance VLSI design
Publication details
- Journal / source
- Laser and Particle Beams
- Publisher
- Shanghai Institute of Optics and Fine Mechanics
- Volume
- 44
- Issue
- 1
- Pages
- 50001–50001
- Publication date
- 1 January 2026
- Language
- EN