A Decennial Thermoluminescent Dosimetry Analysis of Occupational Deep and Shallow Doses at a Nigerian Tertiary Hospital (2015–2024)

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Authors: Salihu A. Yusuf, Halilu Solomon Daniel, Abdulmumini K. Yusuf
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Abstract

Background: Occupational exposure to ionizing radiation is an unavoidable risk in diagnostic radiology. Long-term monitoring of radiation dose to healthcare workers is essential for ensuring compliance with international safety standards and minimizing deterministic and stochastic health effects (ICRP, 2007; UNSCEAR, 2020).  Objective: To evaluate decennial trends (2015–2024) in occupational radiation exposure among diagnostic radiology personnel at Abubakar Tafawa Balewa University Teaching Hospital (ATBUTH), Bauchi, Nigeria, using thermoluminescent dosimetry.  Methods: A retrospective longitudinal study was conducted among 30 radiology personnel with uninterrupted thermoluminescent dosimeter (TLD) monitoring. Quarterly deep dose equivalent (Hₚ(10)) and shallow dose equivalent (Hₚ(0.07)) values were aggregated annually and analyzed descriptively. Observed doses were compared with International Commission on Radiological Protection (ICRP) occupational dose limits.  Results: The mean annual effective dose (Hₚ(10)) was 2.00 ± 0.60 mSv, representing approximately 10% of the ICRP annual occupational limit. Radiographers recorded the highest exposure levels, followed by radiologists, while technicians had the lowest doses. Occasional quarterly elevations—particularly in shallow dose—were observed. Occupational radiation exposure among diagnostic radiology personnel at ATBUTH remained within internationally recommended limits over the ten-year period. However, episodic dose increases highlight the need for continuous optimization of radiation protection practices and sustained training programs.

Fields of Study & Subjects

Radiation Dose and Imaging Advanced Radiotherapy Techniques Radiology practices and education

Publication details

Journal / source
International Journal of Innovative Science and Research Technology (IJISRT)
Pages
3251–3251
Publication date
7 February 2026