Free-Colloid-Probe Atomic Force Microscopy (fCP-AFM) for Nanotribology of Sliding and Rolling Contacts (3D model of microparticle holder)

Repository for Publications and Research Data (ETH Zurich) 2026 Open access

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Authors: Simon Scherrer
DOI: 10.3929/ethz-c-000792163
Cited by: 0

Fields of Study & Subjects

Force Microscopy Techniques and Applications Adhesion Friction and Surface Interactions Tribology and Lubrication Engineering

Publication details

Journal / source
Repository for Publications and Research Data (ETH Zurich)
Publication date
12 January 2026
Language
EN