Accuracy Study on X-Ray Stress Measurement Using Fourier Analysis of Debye-Scherrer Ring

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Authors: Shoichi Ejiri, Hiroaki Ohba, Toshihiko Sasaki
Cited by: 0
References: 4

Abstract

Conventionally, the sin 2 ψ method has been used as X-ray stress measurement. However, in recent years, the XRD 2 method and the cos α method have been put into practical use and spreading. In addition, the Fourier analysis method that shares the same measurement principle of the cos α method has been developed and is attracting attention. Therefore, in this paper, the Fourier analysis method is examined from the measurement theory and the measurement accuracy is investigated. It is reviewed that the basic equation is a finite Fourier series, and that stress can be determined from the Fourier coefficients by using coordinate transformations. Then, while comparing it with the multiple regression analysis, the accuracy of the Fourier analysis method is discussed by using numerical calculations.

Fields of Study & Subjects

X-ray Diffraction in Crystallography Electron and X-Ray Spectroscopy Techniques Surface Treatment and Residual Stress

Publication details

Journal / source
Key engineering materials
Volume
1039
Pages
23–29
Publication date
14 January 2026