Cross-correlation on a single channel for resistance noise measurements

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Authors: Tim Thyzel
Cited by: 0

Abstract

Cross-correlation is an established tool to reduce the background in resistance noise measurements. However, the conventional method requires the amplifier, demodulator and digitizer channels to be duplicated, increasing the cost and complexity of the measurement circuit. We propose an alternating-current technique that allows cross-correlation with only a single channel by modulating the device under test with two carrier frequencies simultaneously. Using multiple software-based demodulators, we show that this method produces accurate amplitude measurements and noise spectra. The signal-to-noise-ratio is improved by 7 decibel for standard parameters. Longer measurement durations increase this improvement, which makes the new technique a true cross-correlation method.

Fields of Study & Subjects

Advanced Electrical Measurement Techniques Analog and Mixed-Signal Circuit Design Quantum and electron transport phenomena

Publication details

Journal / source
arXiv (Cornell University)
Publication date
13 February 2026
Language
EN
Document type
Preprint