Data from: Magnetically modified double slit-based X-ray interferometry
Abstract
We performed x-ray based double slit diffraction with one of the slits covered with magnetic material. We then performed the experiment and collected double slit diffraction pattern as a function of external applied field. The dataset included here shows how the fringe moves as a function of applied field and how we can extract optical constant and ultimately relate to magnetization.
Publication details
- Journal / source
- DRYAD
- Publication date
- 27 February 2026
- Language
- EN
- Document type
- Dataset