Supplementary material to "Voltage Scanning to Calibrate Multi-Reagent Chemical Ionization Mass Spectrometers (MR-CIMS): From Signal to Sensitivity"

Yuwei Wang; Aristeidis Voliotis; Emily Matthews; Rongrong Wu; Milan Roska; Max G. Adam; René Dubus; Lukas Kesper; Franz Rohrer; Robert Wegener; Benjamin Winter; Kelvin H. Bates; Quanfu He; Thorsten Hohaus; Achim Grasse; Ralf Tillmann; Andreas Wahner; Hui Wang; Christian Wesolek; Sergej Wedel; Yizhen Wu; Sören R. Zorn; Manjula R. Canagaratna; Douglas R. Worsnop; Felipe D. Lopez‐Hilfiker; Georgios I. Gkatzelis; Hugh Coe; Thomas J. Bannan

doi:10.5194/egusphere-2025-6102-supplement

Supplementary material to "Voltage Scanning to Calibrate Multi-Reagent Chemical Ionization Mass Spectrometers (MR-CIMS): From Signal to Sensitivity"

2026 Open access

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Authors: Yuwei Wang, Aristeidis Voliotis, Emily Matthews, Rongrong Wu, Milan Roska, Max G. Adam, René Dubus, Lukas Kesper, Franz Rohrer, Robert Wegener, Benjamin Winter, Kelvin H. Bates

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Quanfu He, Thorsten Hohaus, Achim Grasse, Ralf Tillmann, Andreas Wahner, Hui Wang, Christian Wesolek, Sergej Wedel, Yizhen Wu, Sören R. Zorn, Manjula R. Canagaratna, Douglas R. Worsnop, Felipe D. Lopez‐Hilfiker, Georgios I. Gkatzelis, Hugh Coe, Thomas J. Bannan

DOI: 10.5194/egusphere-2025-6102-supplement

Cited by: 0

Fields of Study & Subjects

Mass Spectrometry Techniques and Applications Ion-surface interactions and analysis Plasma Diagnostics and Applications

Publication details

Publication date: 19 January 2026