Enhancing Certified Robustness in Few-Shot Classification with Contrastive Loss and Defensive Noise in Fine-Tuning

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Authors: Hiroya Kato, Seira Hidano, Takao Murakami, Hideitsu Hino
Cited by: 0

Fields of Study & Subjects

Adversarial Robustness in Machine Learning Domain Adaptation and Few-Shot Learning Machine Learning and Data Classification

Publication details

Journal / source
International Conference on Information Systems Security and Privacy (ICISSP)
Pages
169–180
Publication date
1 January 2026
Language
EN