Data of Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures
Abstract
The raw data (.tif) of the paper: Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures. Paper Link: https://iopscience.iop.org/article/10.1088/2053-1583/ae33d0
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 18 February 2026
- Document type
- Dataset