Data of Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures

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Authors: Zhenghan Peng
Cited by: 1

Abstract

The raw data (.tif) of the paper: Hyperspectral Optical Microscopy for Characterization of 2D Semiconductors and Heterostructures. Paper Link: https://iopscience.iop.org/article/10.1088/2053-1583/ae33d0

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
18 February 2026
Document type
Dataset