tum-ees/DegradationModeAnalysis: v2.2.0: optional resistance offset between pOCV and OCV

New optional resistance offset between the measured pOCV and the reconstructed OCV (s.allowResistanceOffset, default off). A pOCV is measured at a small but finite current, so it does not lie on the OCV; one fitted resistance closes that gap instead of letting the level error leak into the degradation modes. Ninth parameter slot; sign from s.direction, current from s.pOCVCurrent (required when the offset is on) Capacity-normalised bound in Ohm*Ah (s.resistanceOffsetLimit); s.allowNegativeResistanceOffset opens the lower half Reaches only the OCV objective; warns when enabled with s.weightOCV = 0 Default off reproduces v2.1.1 bit for bit New check suite tests/check_resistance_offset.m, including an end-to-end fit through dma_core Details in the CHANGELOG.