Self-consistent Band Structure Calculations and Analysis of mK-Transport Data on HgTe/HgCdTe Topological Insulators

This repository contains calculation results, processed experimental data, metadata, and code analyzing the subband density evolution with gate voltage on HgTe/HgCdTe topological insulator devices with thicknesses of 26nm, 45nm, 70nm, and 107nm. The analysis on the 45nm sample is contained in a single folder. The other folders are organized by figure. Metadata and details on the band structure calculations and analysis are included in the Jupyter notebooks and/or found in separate README.md markdown files. The analysis of the raw measurement data and resulting processed data files are organized in a separate folder. The raw measurement data from which the processed data in this repository is derived from has been previously published in [1]. # File information`data_and_code.zip` Zip-compressed archive of figure and measurements folders. # File Extensions- `*.md` Markdown metadata file- `*.csv` Comma-separated values of calculation results and processed experimental data- `*.ipynb` Jupyter Notebook file for data analysis and drawing a figure- `*.mplstyle` Matplotlib style sheet used in Jupyter Notebook files for drawing a figure- `*.py` Python script for drawing a figure- `*.tex` LaTex document for drawing a figure [1] M. Hofer, C. Fuchs, L. Fürst, T. Kießling, W. Beugeling, S. Steffen, H. Buhmann, and L. W. Molenkamp, Analysis of mK-transport data on HgTe/HgCdTe thin films, https://doi.org/10.5281/zenodo.15753790 (2025).