CE-RISE Traceability and Life Cycle Event

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Authors: Boero, Riccardo
Cited by: 0

Abstract

The Traceability and Life Cycle Events data model captures dynamic event-based information throughout the supply chain journey and entire lifecycle of products, materials, batches, and commodities. This model is part of the CE-RISE Digital Product Passport (DPP) and Digital Material Passport (DMP) architecture, focusing specifically on time-stamped events that occur during supply chain operations. Compatible with GS1 EPCIS 2.0 standard.

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
24 June 2026