CE-RISE Traceability and Life Cycle Event
Abstract
The Traceability and Life Cycle Events data model captures dynamic event-based information throughout the supply chain journey and entire lifecycle of products, materials, batches, and commodities. This model is part of the CE-RISE Digital Product Passport (DPP) and Digital Material Passport (DMP) architecture, focusing specifically on time-stamped events that occur during supply chain operations. Compatible with GS1 EPCIS 2.0 standard.
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 24 June 2026