Introducing a Flakiness Score within Embedded Systems Development: An Experience Report - Online Appendix

Zenodo (CERN European Organization for Nuclear Research) 2026 Dataset Open access

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Authors: Kisaakye, Joanna, Neel, Erik, Beyazıt, Mutlu, Demeyer, Serge
DOI: 10.5281/zenodo.17977561
Cited by: 0

Abstract

This is the online appendix for the paper "Introducing a Flakiness Score within Embedded Systems Development: An Experience Report". It contains the results of the questionnaire administered during the study and the questionnaire itself.

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
20 April 2026
Document type
Dataset