AIthena - D4.2 Report on physical set-up, digital twin and hybrid testing approaches

Zenodo (CERN European Organization for Nuclear Research) 2026 Open access

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Authors: Konstantinos Gkentsidis, Nil Munte, Guido Linden, Raul Sena Ferreira, Alexandru Forrai, Martijn Harmenzon, Marc Facerías, Marc Henry Perez, Ilma Okanovic
DOI: 10.5281/zenodo.18131454
Cited by: 0

Fields of Study & Subjects

VLSI and Analog Circuit Testing 3D IC and TSV technologies Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
2 January 2026