Wafer Local Loop with Encapsulated Carrier & Circular Sloped Track
Abstract
Advanced semiconductor fabs require repeated, precise wafer handling for processes such as cleaning, deposition, etching, and measurement. Traditional floor-by-floor or linear transport introduces excessive vertical movement, vibration, and contamination risk. This proposal introduces a local loop system with encapsulated carriers and circular sloped tracks to reduce handling complexity and improve wafer stability.
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 6 January 2026