mDfS workflow definition and library
Abstract
This is the library and decorated workflow for experiments with multispectral dark-field scattering profilometry (mDfS) as e.g. published in Christopher Taudt et al., “Darkfield-Scattering Surface Analysis in Powder-Based AM-Processes: Analysis of a Multiwavelength Approach,” Laser 3D Manufacturing XII 13354 (March 2025): 6–12, https://doi.org/10.1117/12.3043198.
Fields of Study & Subjects
Surface Roughness and Optical Measurements
Additive Manufacturing Materials and Processes
Optical measurement and interference techniques
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 13 January 2026