Dielectric function of amorphous Selenium

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Authors: Yael Gutierrez Vela, María Losurdo
Cited by: 0

Abstract

Data available This dataset contains the dielectric function of amorphous selenium, measured on a thin film deposited by chemical transport by spectroscopic ellipsometry. The fitting of the ellipsometric data was performed using a double Tauc-Lorentz oscillator. Structure of the files The data file consists of five columns. Each row corresponds to a distinct photon energy value. The columns are ordered as follows: Photon energy (eV) Real part of the dielectric function, Re(ε) Imaginary part of the dielectric function, Im(ε) Refractive index, n Extinction coefficient, k

Fields of Study & Subjects

Phase-change materials and chalcogenides Chalcogenide Semiconductor Thin Films Optical Polarization and Ellipsometry

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
13 January 2026
Document type
Dataset