Dielectric function of amorphous Selenium
Abstract
Data available This dataset contains the dielectric function of amorphous selenium, measured on a thin film deposited by chemical transport by spectroscopic ellipsometry. The fitting of the ellipsometric data was performed using a double Tauc-Lorentz oscillator. Structure of the files The data file consists of five columns. Each row corresponds to a distinct photon energy value. The columns are ordered as follows: Photon energy (eV) Real part of the dielectric function, Re(ε) Imaginary part of the dielectric function, Im(ε) Refractive index, n Extinction coefficient, k
Fields of Study & Subjects
Phase-change materials and chalcogenides
Chalcogenide Semiconductor Thin Films
Optical Polarization and Ellipsometry
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 13 January 2026
- Document type
- Dataset