Supplementary data for "3D Mapping of Defects and Moiré Corrugations via Electron Ptychography Atomic Coordinate Retrieval"

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Authors: Jeffrey Huang, Yichao Zhang, Sang Hyun Bae, Ballal Ahammed, Elif Ertekin, Pinshane Huang
Cited by: 0

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Advanced X-ray Imaging Techniques Advanced Materials Characterization Techniques

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
1 February 2026
Language
EN