Process Optimization of Multilayer PCB Fabrication Using Statistical Design of Experiments for Yield and Defect Reduction

Zenodo (CERN European Organization for Nuclear Research) 2026 Open access

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Authors: Ward Gloria
DOI: 10.5281/zenodo.18261463
Cited by: 0

Fields of Study & Subjects

Optimal Experimental Design Methods Industrial Vision Systems and Defect Detection Electronic Packaging and Soldering Technologies

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
15 January 2026