Scanning Electron Microscopy Datasets for Industrial Defect Detection

Zenodo (CERN European Organization for Nuclear Research) 2026 Dataset Open access

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Authors: Anonymous Author(s)
DOI: 10.5281/zenodo.18266855
Cited by: 0

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Non-Destructive Testing Techniques Electron and X-Ray Spectroscopy Techniques

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
16 January 2026
Document type
Dataset