Data for Atomic-Scale Topography of Freestanding Oxide Films by Electron Ptychography

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Authors: Huaicheng Yuan, Zhen Chen
Cited by: 0

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques

Publication details

Journal / source
Zenodo (CERN European Organization for Nuclear Research)
Publication date
16 January 2026
Document type
Dataset