Precise structure and polarization determination of Hf0.5Zr0.5O2 with electron ptychography
Abstract
This is the article's raw data and reconstructed files.
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Advanced Electron Microscopy Techniques and Applications
X-ray Diffraction in Crystallography
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 26 January 2026
- Document type
- Dataset