Atomic_Force_Microscopy_WP3_FORTH
Abstract
This dataset was generated as part of DYNASTY project activities (specifically WP3, samples preparation, data production and data analysis), to support the characterization of the physical properties of van der Waals heterojunctions. Atomic Force Microscopy was carried out to evaluate the topography of MoS2 monolayers on top of dielectric nanoantennas
Fields of Study & Subjects
2D Materials and Applications
Force Microscopy Techniques and Applications
Graphene research and applications
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 27 January 2026
- Document type
- Dataset