MichaelaSchauer/Device-Monitoring-Sample-and-Element-Precision: v1.0
Abstract
Original Code for R-based evaluation of handheld pXRF data focused on device monitoring, sample and element-level precision: Schauer M., Device Monitoring, Sample and Element Precision for Analytical Data in handheld pXRF studies - Evaluation in R. Supplementary Material to Schauer 2026
Fields of Study & Subjects
X-ray Spectroscopy and Fluorescence Analysis
Electron and X-Ray Spectroscopy Techniques
Cultural Heritage Materials Analysis
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 31 January 2026