Structural Interpretation of Reliability in Tantalum Capacitor Anodes
Fields of Study & Subjects
Semiconductor materials and devices
Ferroelectric and Piezoelectric Materials
Electronic Packaging and Soldering Technologies
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 17 February 2026
- Language
- EN
- Document type
- Book