Improving detection and figures of merit in single-particle inductively coupled plasma-mass spectrometry via transient event heights

Single-particle inductively coupled plasma-mass spectrometry (SP-ICP-MS) is a powerful method for characterizing micro- and nanoparticulate materials. The technique primarily relies on the linear relationship between the integrated intensities of individual events (peak areas) and the analyte mass, though transit times (peak widths) have also been used for quantitative purposes. This work (1) evaluates the potential of using peak heights as analytical signals in SP-ICP-MS, (2) introduces a new method for determining peak heights, and (3) explores scenarios in which peak height offers added value over the commonly used SP-ICP-MS signals.