Radiation-Induced Reliability Degradation in Semiconductor Devices Used in Nuclear Reactor Instrumentation: A Review

Semiconductor electronics play a major role in the monitoring and control of critical reactor parameters in nuclear reactor instrumentation systems. Nevertheless, these devices function in high-radiation settings where exposure to neutrons, gamma rays, and mixed-field radiation can eventually impair device performance. The dependability deterioration caused by radiation in semiconductor devices used in nuclear reactor equipment is comprehensively examined in this paper. It discusses damage mechanisms, such as displacement damage and total ionising dose (TID) effects, and looks at how they affect signal processing circuits, amplifiers, and sensors. Additionally addressed are a number of hardening and dependability options, including radiation-hardened-by-design (RHBD) approaches, shielding techniques, and redundancy methods. The study concludes by pointing out research gaps and highlighting new avenues for enhancing electronics' long-term performance and safety in nuclear reactor settings. This work gathers current knowledge in the subject and can be used as a reference by researchers and engineers involved in the design and maintenance of nuclear reactor monitoring systems.