Nitro-oxidative status of Phytophthora infestans exposed to copper
Abstract
The data obtained in the frame of research concerning the effect of copper (Cu) on Phytophthora infestans (Mont.) de Bary, the main cause of potato late blight. The studies were performed on two pathogen isolates, i.e., avirulent (Avr) MP946 and virulent vr MP324, in reference to the potato plant cultivar Bzura. The pathogen was growing in the presence of Cu ions for 21 days. The Cu ions were applied at two concentrations, i.e., 5 and 10 mg/L, reflecting moderate and sublethal stress, respectively. This set of data includes: Cell viability Lipid peroxidation (TBARS level) Reactive oxygen species (ROS) formation (superoxide radical anion, hydrogen peroxide) Reactive nitrogen species (RNS) formation (nitric oxide, peroxynitrite, nitroxyl) AP-sites formation in DNA 8-nitroguanine (8-NG) levels in RNA and DNA pools 8-hydroxyguanine (8-OHG) level in RNA 8-Hydroxy-2-deoxyguanosine (8-OHdG) level in DNA S-nitrosothiols (SNOs) level Nitrated protein (3-NT) level Carbonylated protein (PC) level The study was carried out within the project: Insight into the mechanism of the toxic effect of copper on Phytophthora infestans - the causative agent of potato late blight, no., 2021/41/N/NZ9/01525, financed by the National Science Centre, Poland.
Fields of Study & Subjects
Plant Pathogens and Resistance
Plant Stress Responses and Tolerance
Fungal Plant Pathogen Control
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 11 March 2026
- Language
- EN
- Document type
- Dataset