Comprehensive Digital Memory Testing and Diagnostics: Symbolic Models, Optimization Tools, and Self-Healing Architectures
Abstract
This monograph presents a comprehensive framework for the testing and diagnostic analysis of modern digital memory systems. The work integrates symbolic operator models, optimization methods, and scalable diagnostic architectures to improve fault coverage, diagnostic efficiency, and adaptive test execution in large-scale memory devices.
Fields of Study & Subjects
VLSI and Analog Circuit Testing
Software Testing and Debugging Techniques
Radiation Effects in Electronics
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 15 March 2026
- Language
- EN
- Document type
- Book