The Substrate Separation Principle: Why More Reasoning Cannot Fix Biased Reasoning
Abstract
SSP formalizes why same-substrate verification reduces noise but not bias. This version adds Section 5.5: Connection to R dimensionality testing. SSP explains why institutional resistance appears multi-dimensional (each measurement substrate captures a different resistance mode).
Fields of Study & Subjects
Distributed Sensor Networks and Detection Algorithms
VLSI and Analog Circuit Testing
Modular Robots and Swarm Intelligence
Publication details
- Journal / source
- Zenodo (CERN European Organization for Nuclear Research)
- Publication date
- 23 May 2026
- Document type
- Preprint