Formation of nanoscale vapour films governing thermal resistance in amorphous ice

This repository contains processed data and example codes relate to the manuscript titled "Formation of nanoscale vapour films governing thermal resistance in amorphous ice" Authors: Yizhi Liu*, Tobias Eklund*, Aigerim Karina, Svenja Hövelmann, Robert PC Bauer, Seonju You, Claudia Goy, Nele N. Striker, Alexander Gierke, Kenneth Hess, Kai Schlage, Lars Bocklage, Fernando Ardana Lamas, Hao Wang, Yifeng Jiang, Yohei Uemara, Chris Milne, Kyung Hwan Kim, Bridget Murphy, Felix Lehmkühler, Peter Zalden, Katrin Amann-Winkel Communications Chemistry volume 9, Article number: 289 (2026) https://doi.org/10.1038/s42004-026-02177-2 Author contribution: *These authors contributed equally to this work Conceptualization of the experiment: T.E., K. A.-W., P.Z., F.L.; Conduction of experiment at FXE: T.E., A.K., S.H., R.PC.B., S.Y., C.G., N.N.S., A.G., K.H., F.A.L., H.W., Y.J., Y.U., C.M., K.H.K., B.M., F.L., P.Z., K.A-W.; Preparation of wafers: K.S., L.B., T.E., P.Z.; Data analysis of X-ray data: T.E., Y.L., S.H., R.PC.B., S.Y., K.H.K.; MD- and finite element simulations: Y.L.; Writing of manuscript: Y.L., T.E, P.Z., K. A.-W., with support of all authors; Supervision and funding acquisition: K. A.-W., P.Z.., F.L.; Data have been collected at the FXE instrument at the European XFEL. Raw data are stored on the cluster at EuXFEL infrastructure and are available upon request. (https://doi.org/10.22003/XFEL.EU-DATA-003273-00 (2026).) Contact: amann-winkel@uni-mainz.de; amannk@mpip-mainz.mpg.de