Validating electron pair distribution function analysis: The role of multiple scattering, beam, measurement, and processing parameters

KITopen 2026 Open access

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Authors: Kang, Sangjun, Cho, Hyeyoung, Töllner, Maximilian, Wollersen, Vanessa, Wang, Di, Baik, Hionsuck, Perera, Marie Joëlle, Adjaoud, Omar, Albe, Karsten, Kübel, Christian, Mu, Xiaoke
DOI: 10.5445/ir/1000188519
Cited by: 0

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Advanced X-ray Imaging Techniques

Publication details

Journal / source
KITopen
Publication date
1 January 2026
Language
EN