LHD HIBPcp #197319.1

NIFS 2026 Dataset Open access

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Authors: Akihiro SHIMIZU, M. Nishiura
DOI: 10.57451/lhd.hibpcp.197319.1
Cited by: 0

Abstract

Heavy Ion Beam Probe (HIBP) to measure electric potential, its fluctuation, density fluctuation, and their spatial profiles, which uses sputter-type negative ion source producing Au- and Cu- beams (

Publication details

Journal / source
NIFS
Publication date
6 January 2026
Language
EN
Document type
Dataset