LHD PCIFINE #200070.1

NIFS 2026 Dataset Open access

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Authors: K. Tanaka
DOI: 10.57451/lhd.pcifine.200070.1
Cited by: 0

Abstract

Fluctuation Measurement using a Phase Contrast Imaging (PCI) for High Temperature Plasma

Publication details

Journal / source
NIFS
Publication date
7 January 2026
Language
EN
Document type
Dataset