Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features

ScienceDB 2026 Dataset Open access

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Authors: 朱美萍
DOI: 10.57760/sciencedb.36811
Cited by: 0

Abstract

Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features.Including Structure of films,. Heatmap of Spearman Correlation Coefficients Between Thin Film Parameters and XRR Curve Feature Parameters and so on.

Fields of Study & Subjects

Machine Learning in Materials Science X-ray Diffraction in Crystallography X-ray Spectroscopy and Fluorescence Analysis

Publication details

Journal / source
ScienceDB
Publication date
2 February 2026
Language
EN
Document type
Dataset