Dual-spot Infrared Microscopic Photoelectric Testing System

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Authors: he ting
Cited by: 0

Abstract

The dual spot infrared micro photoelectric testing system has the ability of dual beam collaborative excitation characterization, which can modulate and excite the new intelligent photoelectric detector in the same/different wavelength range from visible 0.4 μ m to short wave infrared 2 μ m, achieving excitation spatial resolution of visible light 0.63 μ m and infrared light 1.8 μ m. Solved the characterization problem of multi mechanism collaboration of micro area photocurrent in the research of new photodetectors, revealed the local grid controlled intelligent photoelectric sensing and recognition mechanism, and provided a powerful characterization method for the analysis of wideband and high response new intelligent photodetectors.

Fields of Study & Subjects

Advanced Semiconductor Detectors and Materials Advanced Measurement and Detection Methods CCD and CMOS Imaging Sensors

Publication details

Journal / source
ScienceDB
Publication date
15 March 2026
Language
ZH
Document type
Dataset