Dual-spot Infrared Microscopic Photoelectric Testing System
Abstract
The dual spot infrared micro photoelectric testing system has the ability of dual beam collaborative excitation characterization, which can modulate and excite the new intelligent photoelectric detector in the same/different wavelength range from visible 0.4 μ m to short wave infrared 2 μ m, achieving excitation spatial resolution of visible light 0.63 μ m and infrared light 1.8 μ m. Solved the characterization problem of multi mechanism collaboration of micro area photocurrent in the research of new photodetectors, revealed the local grid controlled intelligent photoelectric sensing and recognition mechanism, and provided a powerful characterization method for the analysis of wideband and high response new intelligent photodetectors.
Fields of Study & Subjects
Advanced Semiconductor Detectors and Materials
Advanced Measurement and Detection Methods
CCD and CMOS Imaging Sensors
Publication details
- Journal / source
- ScienceDB
- Publication date
- 15 March 2026
- Language
- ZH
- Document type
- Dataset