Electron Microscopy Images of Layered Boron Nitride with Visible Moiré Patterns

The dataset contains raw high-resolution STEM and HRTEM images of epitaxial layered boron nitride (BN) acquired for the study "Moiré Patterns and Polytype Mapping of Epitaxial Boron Nitride by Electron Microscopy." The data support the investigation of moiré patterns, interlayer twist angles, and BN polytypes (h-BN, r-BN, and b-BN) in MOVPE-grown epitaxial films on sapphire. Moiré patterns visible in planar-view STEM images were used to identify the crystal polytypic structure and twist angles between layers.