Merlin FESEM

Our Carl Zeiss Merlin SEM is a high-resolution Field Emission Scanning Electron Microscope (FE-SEM) designed for low-voltage imaging of delicate samples with resolution better than one nanometer. The Merlin has several low-noise backscatter and secondary electron detectors, a novel charging compensation mode, and has become our primary tool for studying soft materials samples such as polymers, nanoparticles, and active biological materials such as patterned silicon nanowires. An Oxford Ultim Max 100 EDS system with AzetcLive enables ultrafast elemental characterization and mapping.