Supplementary document for Dual-probe photothermal microscopy for suppression of side-lobe artifacts - 7738393.pdf

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Authors: JUN MIYAZAKI, Riku Ikeya
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Fields of Study & Subjects

Thermography and Photoacoustic Techniques Integrated Circuits and Semiconductor Failure Analysis Near-Field Optical Microscopy

Publication details

Journal / source
Figshare
Publication date
1 January 2026