Supplementary document for Fano Resonance Asymmetry for Reliable Characterization of Dielectric Film over a Broad Thickness Range - 7749443.pdf
Fields of Study & Subjects
Microwave and Dielectric Measurement Techniques
Near-Field Optical Microscopy
Metamaterials and Metasurfaces Applications
Publication details
- Journal / source
- Figshare
- Publication date
- 1 January 2026