Supplementary document for Seidel-based position-dependent aberration correction in Fourier holography - 7805853.pdf
Abstract
Supplement 1 in the main manuscript. Proves formulas used in the main text and shows extended discussion of less relevant results that were not included in the main manuscript.
Fields of Study & Subjects
Digital Holography and Microscopy
Optical measurement and interference techniques
Advanced X-ray Imaging Techniques
Publication details
- Journal / source
- Figshare
- Publication date
- 27 February 2026
- Language
- EN