Supplementary document for High-resolution infrared speckle wavemeter under weak illumination via Sum-Frequency Generation in thin-film lithium niobate - 7805656.pdf

Figshare 2026 Open access

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Authors: Jing Li, Deng Guoliang, jie Wu, Shi Chaoying, Yuehong Zhu, haixin chen, Hao Zhou, Huomu Yang, Shouhuan Zhou
DOI: 10.6084/m9.figshare.31431301
Cited by: 0

Abstract

This supplementary document supplements the wavelength meter's identification results in the 1550nm and 1551nm bands, indicating that the wavelength meter's operating bandwidth is 3nm.

Fields of Study & Subjects

Photorefractive and Nonlinear Optics Laser-Matter Interactions and Applications Quantum Information and Cryptography

Publication details

Journal / source
Figshare
Publication date
12 March 2026
Language
EN