Improving-Combined-Detection-and-Classification-of-TEM-Defects-via-Mask-Conditioned-Latent-Diffusion

Figshare 2026 Open access

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Authors: Ni Li
DOI: 10.6084/m9.figshare.31440037
Cited by: 0

Abstract

Models and configurations of Mask-conditioned LDM model and Mask R-CNN model used for the paper: Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
Figshare
Publication date
1 March 2026
Language
EN