supplemental materials

AIP Publishing 2026 Open access

Read full text
Authors: Mengxin Yan, Hanxiao Peng, Yunchong Li, Haomiao Li, Zhihang Zhang, Zubair Maroof, Zhaoxin Wu, Bo Jiao
DOI: 10.60893/figshare.adv.30844172.v1
Cited by: 0

Abstract

Figure S1 show the top-view and cross-section view of m-Al2O3 layer; Figure S2 show the optical microscope images of Cs₂TeI₆ thick films fabricated by different TMB doping ratios; Figure S3 shows the XRD patterns of Cs₂TeI₆ thick films fabricated by different TMB doping ratios; Figure S4 shows the X-ray response of Cs₂TeI₆ detector exposed to ambient air for 90 days.

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026