Supplementary Material: Experimental setup, diffraction indexing, and dislocation density estimation model for shock-compressed silicon
Abstract
This Supplementary Material provides additional technical details and theoretical models supporting the main text. It includes:
Fields of Study & Subjects
High-Velocity Impact and Material Behavior
High-pressure geophysics and materials
X-ray Diffraction in Crystallography
Publication details
- Journal / source
- AIP Publishing
- Publication date
- 4 March 2026
- Language
- EN