Supplementary Material
Abstract
Additional characterization, including optical spectra and bandgap estimation, FTIR spectra and absorbance analysis, time-resolved photoluminescence and fitting parameters, AFM images of QD films, normalized electroluminescence spectra and time-resolved electroluminescence spectra of devices A-C.
Fields of Study & Subjects
Quantum Dots Synthesis And Properties
Semiconductor Quantum Structures and Devices
GaN-based semiconductor devices and materials
Publication details
- Journal / source
- AIP Publishing
- Publication date
- 1 January 2026
- Language
- EN