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AIP Publishing 2026 Open access

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Authors: Hao-Nan Li, Lei Wang, Jiang Zhu, Yi-Xing He, Xian-Qin Liu, Yueqi Wang, Siwen Zhang, Jia-Yu Wang, Shu-Ming Zhao, Yong-Qi Zhou, Haijiao MA, Yue Hao
+1 more Jincheng Zhang
DOI: 10.60893/figshare.apl.30916421
Cited by: 0

Abstract

Some extensions of characterization and test data,such as TEM, XPS and memristor retention data in different temperature.

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Journal / source
AIP Publishing
Publication date
1 January 2026